Limitations of Debye-Waller lattice temperature extraction under electronic excitation

Fuente: arXiv
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Main Authors: Medvedev, N., Kopecky, M., Chalupsky, J., Juha, L.
Format: Preprint
Published: 2026
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_version_ 1866917496219500544
author Medvedev, N.
Kopecky, M.
Chalupsky, J.
Juha, L.
author_facet Medvedev, N.
Kopecky, M.
Chalupsky, J.
Juha, L.
contents Ultrafast diffraction is the cutting-edge technique to extract the atomic temperature at femtosecond timescales, and further related quantities - in particular, electron-phonon coupling strength at elevated electronic temperatures. The present work demonstrates limitations of such an analysis, emphasizing the importance of careful evaluation of the evolution of the Debye temperature. It is shown that, due to the sensitivity of the Debye-Waller analysis to this parameter, neglecting its changes under electronic excitation may lead to significant deviations of the atomic temperature extracted from its true values.
format Preprint
id arxiv_https___arxiv_org_abs_2605_15140
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Limitations of Debye-Waller lattice temperature extraction under electronic excitation
Medvedev, N.
Kopecky, M.
Chalupsky, J.
Juha, L.
Materials Science
Ultrafast diffraction is the cutting-edge technique to extract the atomic temperature at femtosecond timescales, and further related quantities - in particular, electron-phonon coupling strength at elevated electronic temperatures. The present work demonstrates limitations of such an analysis, emphasizing the importance of careful evaluation of the evolution of the Debye temperature. It is shown that, due to the sensitivity of the Debye-Waller analysis to this parameter, neglecting its changes under electronic excitation may lead to significant deviations of the atomic temperature extracted from its true values.
title Limitations of Debye-Waller lattice temperature extraction under electronic excitation
topic Materials Science
url https://arxiv.org/abs/2605.15140