ITHICA: Intra-Thread Instruction Checking Approach for Defect-Induced Silent Data Corruptions

Fuente: arXiv
Guardado en:
Detalles Bibliográficos
Autores principales: Vavelidou, Ioanna, Banerjee, Subho S., Liu, Eric X., Fuller, Mike, Mitra, Subhasish, Trippel, Caroline
Formato: Preprint
Publicado: 2026
Materias:
Acceso en línea:
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
_version_ 1866911687780597760
author Vavelidou, Ioanna
Banerjee, Subho S.
Liu, Eric X.
Fuller, Mike
Mitra, Subhasish
Trippel, Caroline
author_facet Vavelidou, Ioanna
Banerjee, Subho S.
Liu, Eric X.
Fuller, Mike
Mitra, Subhasish
Trippel, Caroline
contents Hyperscaler reports of silent data corruptions (SDCs), presumed to be caused by silicon manufacturing defects, have motivated the development of functional tests for detecting defective CPUs. We present ITHICA, an approach for automatically generating functional tests for defect-induced errors from arbitrary programs by inserting intra-thread, instruction-level error checks, primarily leveraging instruction duplication and output comparison. Our key insight is that the most pernicious defects cause inconsistent errors: two executions of the same instruction within the same thread, given the same inputs, can produce different architectural outputs depending on the execution context in which they run. By exploiting this insight, ITHICA enables arbitrary programs to serve as tests and identifies affected instructions upon error detections. We use ITHICA to transform industrial hyperscaler test programs (our baseline), datacenter workloads, and common libraries into functional tests, and evaluate them on over 3,000 CPU servers. ITHICA error checks detect 39% more defective servers than native checks within the ITHICA tests derived from our baseline programs, and enable novel findings on defect behavior that challenge conclusions drawn by prior hyperscaler fleet studies.
format Preprint
id arxiv_https___arxiv_org_abs_2605_15638
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle ITHICA: Intra-Thread Instruction Checking Approach for Defect-Induced Silent Data Corruptions
Vavelidou, Ioanna
Banerjee, Subho S.
Liu, Eric X.
Fuller, Mike
Mitra, Subhasish
Trippel, Caroline
Hardware Architecture
Software Engineering
Hyperscaler reports of silent data corruptions (SDCs), presumed to be caused by silicon manufacturing defects, have motivated the development of functional tests for detecting defective CPUs. We present ITHICA, an approach for automatically generating functional tests for defect-induced errors from arbitrary programs by inserting intra-thread, instruction-level error checks, primarily leveraging instruction duplication and output comparison. Our key insight is that the most pernicious defects cause inconsistent errors: two executions of the same instruction within the same thread, given the same inputs, can produce different architectural outputs depending on the execution context in which they run. By exploiting this insight, ITHICA enables arbitrary programs to serve as tests and identifies affected instructions upon error detections. We use ITHICA to transform industrial hyperscaler test programs (our baseline), datacenter workloads, and common libraries into functional tests, and evaluate them on over 3,000 CPU servers. ITHICA error checks detect 39% more defective servers than native checks within the ITHICA tests derived from our baseline programs, and enable novel findings on defect behavior that challenge conclusions drawn by prior hyperscaler fleet studies.
title ITHICA: Intra-Thread Instruction Checking Approach for Defect-Induced Silent Data Corruptions
topic Hardware Architecture
Software Engineering
url https://arxiv.org/abs/2605.15638