EntropyScan: Towards Model-level Backdoor Detection in LVLMs via Visual Attention Entropy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ge, Xuanyu, Wang, Zhongqi, Zhang, Jie, Shan, Shiguang, Chen, Xilin
Format:	Preprint
Published:	2026
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2605.15711