Hybrid Quantum-MambaVision: A Quantum-enhanced State Space Model for Calibrated Mixed-type Wafer Defect Detection

Fuente: arXiv

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Bibliographic Details
Main Authors:	Sahoo, Satwik Sai Prakash, Sahoo, Jyoti Prakash, Wang, Ting, Mondal, Subrota Kumar
Format:	Preprint
Published:	2026
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2605.16404