A Heavy Ion Monitor on a Chip Based on a Non-Volatile Memory Architecture -- Part II: Device Characterization & Modeling

Fuente: arXiv

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Bibliographic Details
Main Authors:	Julson, Dale, Youngs, Mike, Lowrey, Hannah, Keltner, David, Hossain, Tim, Fullwood, Clayton
Format:	Preprint
Published:	2026
Subjects:	Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2605.16597