APA-Zitierstil (7. Ausg.)

Frolov, D., Plouchart, J., & Soylu, U. (2026). Direct On-Wafer Measurements of Noise Parameters in C- and X-bands at $T=4$ K.

Chicago-Zitierstil (17. Ausg.)

Frolov, Daniil, Jean-Olivier Plouchart, und Utku Soylu. Direct On-Wafer Measurements of Noise Parameters in C- and X-bands at $T=4$ K. 2026.

MLA-Zitierstil (9. Ausg.)

Frolov, Daniil, et al. Direct On-Wafer Measurements of Noise Parameters in C- and X-bands at $T=4$ K. 2026.