Style de citation APA (7e éd.)

Frolov, D., Plouchart, J., & Soylu, U. (2026). Direct On-Wafer Measurements of Noise Parameters in C- and X-bands at $T=4$ K.

Style de citation Chicago (17e éd.)

Frolov, Daniil, Jean-Olivier Plouchart, et Utku Soylu. Direct On-Wafer Measurements of Noise Parameters in C- and X-bands at $T=4$ K. 2026.

Style de citation MLA (9e éd.)

Frolov, Daniil, et al. Direct On-Wafer Measurements of Noise Parameters in C- and X-bands at $T=4$ K. 2026.