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Direct On-Wafer Measurements of Noise Parameters in C- and X-bands at $T=4$ K

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Frolov, Daniil, Plouchart, Jean-Olivier, Soylu, Utku
Formato:	Preprint
Publicado:	2026
Materias:	Instrumentation and Detectors Instrumentation and Methods for Astrophysics Quantum Physics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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