A Computationally Efficient Reciprocal Effective Roughness Model for Diffuse Scattering

Fuente: arXiv
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Autori principali: Melloni, Giacomo, Vitucci, Enrico M., Esposti, Vittorio Degli, Berweger, Samuel, Chuang, Jack, Gentile, Camillo, Golmie, Nada
Natura: Preprint
Pubblicazione: 2026
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author Melloni, Giacomo
Vitucci, Enrico M.
Esposti, Vittorio Degli
Berweger, Samuel
Chuang, Jack
Gentile, Camillo
Golmie, Nada
author_facet Melloni, Giacomo
Vitucci, Enrico M.
Esposti, Vittorio Degli
Berweger, Samuel
Chuang, Jack
Gentile, Camillo
Golmie, Nada
contents Ray-tracing (RT) has become central to site-specific electromagnetic propagation modeling in dynamic complex environments. Yet its computational burden grows sharply as high-fidelity digital twins of these environments scale to millions of facets whose material parameters must be continuously updated as the environment changes. The challenge is amplified at mmWave and sub-THz frequencies, where surface roughness becomes comparable to the wavelength and so diffuse scattering can account for up to 40% of the received power, making accurate yet tractable models essential. The popular Effective Roughness (ER) approach offers physical consistency but become increasingly costly when highly directive lobes are required or when parameters must be iteratively tuned. This communication introduces a directive, reciprocal diffuse scattering model that preserves the structure of the ER while enabling an order-of-magnitude reduction in computational cost. Validation across eight materials shows no loss in accuracy - and a slight improvement - demonstrating a scalable and physically meaningful solution for RT in scenarios where diffuse scattering is non-negligible.
format Preprint
id arxiv_https___arxiv_org_abs_2605_17988
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle A Computationally Efficient Reciprocal Effective Roughness Model for Diffuse Scattering
Melloni, Giacomo
Vitucci, Enrico M.
Esposti, Vittorio Degli
Berweger, Samuel
Chuang, Jack
Gentile, Camillo
Golmie, Nada
Signal Processing
Optics
Ray-tracing (RT) has become central to site-specific electromagnetic propagation modeling in dynamic complex environments. Yet its computational burden grows sharply as high-fidelity digital twins of these environments scale to millions of facets whose material parameters must be continuously updated as the environment changes. The challenge is amplified at mmWave and sub-THz frequencies, where surface roughness becomes comparable to the wavelength and so diffuse scattering can account for up to 40% of the received power, making accurate yet tractable models essential. The popular Effective Roughness (ER) approach offers physical consistency but become increasingly costly when highly directive lobes are required or when parameters must be iteratively tuned. This communication introduces a directive, reciprocal diffuse scattering model that preserves the structure of the ER while enabling an order-of-magnitude reduction in computational cost. Validation across eight materials shows no loss in accuracy - and a slight improvement - demonstrating a scalable and physically meaningful solution for RT in scenarios where diffuse scattering is non-negligible.
title A Computationally Efficient Reciprocal Effective Roughness Model for Diffuse Scattering
topic Signal Processing
Optics
url https://arxiv.org/abs/2605.17988