López, P. H., Pirker, L., Weston, A., Kayal, A., Nadas, R., Fernández, A. D., . . . Heeg, S. (2026). The Topography Trap: Sifting Interlayer Excitons from Strain-Related Artifacts in Real-World 2D Hetrostructures.
Style de citation Chicago (17e éd.)López, Pablo Hernández, et al. The Topography Trap: Sifting Interlayer Excitons from Strain-Related Artifacts in Real-World 2D Hetrostructures. 2026.
Style de citation MLA (9e éd.)López, Pablo Hernández, et al. The Topography Trap: Sifting Interlayer Excitons from Strain-Related Artifacts in Real-World 2D Hetrostructures. 2026.
Attention : ces citations peuvent ne pas être correctes à 100%.