Step-scan interferometry for high-fidelity hyperspectral nanoscopy

Fuente: arXiv
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Main Authors: Nemeth, Gergely, Borondics, Ferenc
Format: Preprint
Published: 2026
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_version_ 1866916031774064640
author Nemeth, Gergely
Borondics, Ferenc
author_facet Nemeth, Gergely
Borondics, Ferenc
contents Fourier transform infrared nanospectroscopy (nano-FTIR) is a novel, increasingly adopted characterization method that leverages decades of established knowledge in infrared spectroscopy at the nanoscale. It opens up new possibilities in the characterization of composite materials and nanophotonic systems. Besides the rapid adoption and new possibilities, the nanoscale nature of these measurements poses new challenges for infrared spectroscopy. The current implementations of hyperspectral image acquisition at high spatial resolution suffer from significant artifacts due to thermal instabilities, which heavily affect positioning. As a result, the spatial and spectral fidelity of the measurements can be unreliable for long acquisitions. Here, we propose a new nano-FTIR measurement methodology based on step-scan interferometry and image registration. We demonstrate that the method provides superior spatial fidelity for photonics research and enables the collection of larger datasets, paving the way for bringing machine learning to characterize nanoscale heterogeneity.
format Preprint
id arxiv_https___arxiv_org_abs_2605_21249
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Step-scan interferometry for high-fidelity hyperspectral nanoscopy
Nemeth, Gergely
Borondics, Ferenc
Optics
Fourier transform infrared nanospectroscopy (nano-FTIR) is a novel, increasingly adopted characterization method that leverages decades of established knowledge in infrared spectroscopy at the nanoscale. It opens up new possibilities in the characterization of composite materials and nanophotonic systems. Besides the rapid adoption and new possibilities, the nanoscale nature of these measurements poses new challenges for infrared spectroscopy. The current implementations of hyperspectral image acquisition at high spatial resolution suffer from significant artifacts due to thermal instabilities, which heavily affect positioning. As a result, the spatial and spectral fidelity of the measurements can be unreliable for long acquisitions. Here, we propose a new nano-FTIR measurement methodology based on step-scan interferometry and image registration. We demonstrate that the method provides superior spatial fidelity for photonics research and enables the collection of larger datasets, paving the way for bringing machine learning to characterize nanoscale heterogeneity.
title Step-scan interferometry for high-fidelity hyperspectral nanoscopy
topic Optics
url https://arxiv.org/abs/2605.21249