Quantifying the coupling between strain and cation valence in high entropy oxide thin films using electron microscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ayyagari, Sai Venkata Gayathri, Almishal, Saeed SI, Mukherjee, Debangshu, Roccapriore, Kevin M., Maria, Jon-Paul, Alem, Nasim
Format:	Preprint
Published:	2026
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2605.21612