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Quantifying the coupling between strain and cation valence in high entropy oxide thin films using electron microscopy

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Ayyagari, Sai Venkata Gayathri, Almishal, Saeed SI, Mukherjee, Debangshu, Roccapriore, Kevin M., Maria, Jon-Paul, Alem, Nasim
Formato:	Preprint
Publicado:	2026
Materias:	Materials Science
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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