Rethinking Passive RIS: Finite Blocklength Reliability Analysis Under Thermal Noise

Fuente: arXiv

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Bibliographic Details
Main Authors:	Karim, Farjam, Kumar, Deepak, Dharmawansa, Prathapasinghe, Mahmood, Nurul Huda, de Sena, Arthur Sousa, Latva-aho, Matti
Format:	Preprint
Published:	2026
Subjects:	Signal Processing
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2605.21760