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Bibliographic Details
Main Authors: Yeoh, Wei Yi, Lan, Bo, Lowe, Michael J. S.
Format: Preprint
Published: 2026
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Online Access:https://arxiv.org/abs/2605.22024
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author Yeoh, Wei Yi
Lan, Bo
Lowe, Michael J. S.
author_facet Yeoh, Wei Yi
Lan, Bo
Lowe, Michael J. S.
contents Ultrasonic backscatter measurements are widely used for microstructural characterisation. However, in materials containing strong anisotropy and spatial heterogeneity, the interpretation of backscatter signals becomes challenging because distance-dependent propagation effects can obscure genuine microstructural variations across depth. In this paper, a cross-directional compensation method is presented for ultrasonic backscatter measurements acquired from opposing inspection surfaces. The method exploits the reciprocal constraint that the dominant through-thickness propagation bias should contain a shared component between opposing inspection directions. A shared distance-dependent baseline is estimated in the logarithmic amplitude domain using an anchor-based fitting approach and subsequently used to compensate the measured backscatter profiles with depth. The method is demonstrated on two macrozone-containing Ti--6Al--4V samples, where conventional attenuation-based compensation is shown to be insufficient to consistently reconcile opposing-face backscatter profiles. Across six opposing-face signal pairs, the proposed method reduces the mean standard deviation of the directional mismatch profile from $0.367$ to $0.120$ and the mean absolute fitted gradient from $0.171$ to $0.0067$, outperforming conventional attenuation compensation. These results demonstrate that reciprocity-based compensation can reduce propagation-related bias while preserving local direction-dependent scattering variations, providing a practical signal-normalisation framework for backscatter analysis in heterogeneous anisotropic materials.
format Preprint
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institution arXiv
publishDate 2026
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spellingShingle A Reciprocity-Based Signal Compensation Framework for Ultrasonic Backscatter Measurements in Heterogeneous Scattering Media
Yeoh, Wei Yi
Lan, Bo
Lowe, Michael J. S.
Applied Physics
Ultrasonic backscatter measurements are widely used for microstructural characterisation. However, in materials containing strong anisotropy and spatial heterogeneity, the interpretation of backscatter signals becomes challenging because distance-dependent propagation effects can obscure genuine microstructural variations across depth. In this paper, a cross-directional compensation method is presented for ultrasonic backscatter measurements acquired from opposing inspection surfaces. The method exploits the reciprocal constraint that the dominant through-thickness propagation bias should contain a shared component between opposing inspection directions. A shared distance-dependent baseline is estimated in the logarithmic amplitude domain using an anchor-based fitting approach and subsequently used to compensate the measured backscatter profiles with depth. The method is demonstrated on two macrozone-containing Ti--6Al--4V samples, where conventional attenuation-based compensation is shown to be insufficient to consistently reconcile opposing-face backscatter profiles. Across six opposing-face signal pairs, the proposed method reduces the mean standard deviation of the directional mismatch profile from $0.367$ to $0.120$ and the mean absolute fitted gradient from $0.171$ to $0.0067$, outperforming conventional attenuation compensation. These results demonstrate that reciprocity-based compensation can reduce propagation-related bias while preserving local direction-dependent scattering variations, providing a practical signal-normalisation framework for backscatter analysis in heterogeneous anisotropic materials.
title A Reciprocity-Based Signal Compensation Framework for Ultrasonic Backscatter Measurements in Heterogeneous Scattering Media
topic Applied Physics
url https://arxiv.org/abs/2605.22024