QT-PUF: Quantum Tunneling Leakage Based PUF for Implantable IoMT Devices
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arXiv
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| Natura: | Preprint |
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2026
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| author | Ma, Yueqi Mohan, Vivek Chang, Chip-Hong Drakakis, Emmanuel M. |
| author_facet | Ma, Yueqi Mohan, Vivek Chang, Chip-Hong Drakakis, Emmanuel M. |
| contents | The Internet of Medical Things (IoMT) marks a shift toward decentralized healthcare, enabling continuous monitoring and personalized care through connected wearable and implantable devices. However, ensuring the trust and integrity of these devices themselves remains a major challenge, as physical compromise or counterfeiting can directly endanger patient safety, privacy, and data integrity. This work presents QT-PUF, a gate-tunneling-leakage-based physical unclonable function (PUF) that leverages quantum-mechanical gate leakage resulting from process-induced variations in standard CMOS devices. A differential readout circuit with a pseudo-resistor I-to-V frontend is proposed to convert the picoampere-level leakage variations into digital responses. Unlike existing PUFs such as those based on memory, ring oscillators, or arbiters, which are less suitable for ultralow-power IoMT devices (due to additional circuitry, power overhead, or poor stability), QT-PUF requires no external excitation or stabilization and operates under static bias. Simulation-based measurements for a $\mathbf{65}$~nm CMOS process demonstrate an entropy of $\mathbf{0.9999998}$, an FHD of $\mathbf{0.5001}$, and an average power (energy) consumption of $\mathbf{96.04}$~nW/bit ($\mathbf{19.21}$~fJ/bit, respectively) at $\mathbf{1.2\,V}$ and $\mathbf{35\,^{\circ}C}$ for the proposed PUF. It operates reliably across $\mathbf{0.9}\text{--}\mathbf{1.3}$~V and $\mathbf{0}\text{--}\mathbf{100\,^{\circ}C}$ with an average BER below $\mathbf{0.000163}$ across $\mathbf{1.0}\text{--}\mathbf{1.3}$~V and $\mathbf{10}\text{--}\mathbf{70\,^{\circ}C}$ within the operating conditions of typical implantable devices. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2605_22113 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | QT-PUF: Quantum Tunneling Leakage Based PUF for Implantable IoMT Devices Ma, Yueqi Mohan, Vivek Chang, Chip-Hong Drakakis, Emmanuel M. Cryptography and Security The Internet of Medical Things (IoMT) marks a shift toward decentralized healthcare, enabling continuous monitoring and personalized care through connected wearable and implantable devices. However, ensuring the trust and integrity of these devices themselves remains a major challenge, as physical compromise or counterfeiting can directly endanger patient safety, privacy, and data integrity. This work presents QT-PUF, a gate-tunneling-leakage-based physical unclonable function (PUF) that leverages quantum-mechanical gate leakage resulting from process-induced variations in standard CMOS devices. A differential readout circuit with a pseudo-resistor I-to-V frontend is proposed to convert the picoampere-level leakage variations into digital responses. Unlike existing PUFs such as those based on memory, ring oscillators, or arbiters, which are less suitable for ultralow-power IoMT devices (due to additional circuitry, power overhead, or poor stability), QT-PUF requires no external excitation or stabilization and operates under static bias. Simulation-based measurements for a $\mathbf{65}$~nm CMOS process demonstrate an entropy of $\mathbf{0.9999998}$, an FHD of $\mathbf{0.5001}$, and an average power (energy) consumption of $\mathbf{96.04}$~nW/bit ($\mathbf{19.21}$~fJ/bit, respectively) at $\mathbf{1.2\,V}$ and $\mathbf{35\,^{\circ}C}$ for the proposed PUF. It operates reliably across $\mathbf{0.9}\text{--}\mathbf{1.3}$~V and $\mathbf{0}\text{--}\mathbf{100\,^{\circ}C}$ with an average BER below $\mathbf{0.000163}$ across $\mathbf{1.0}\text{--}\mathbf{1.3}$~V and $\mathbf{10}\text{--}\mathbf{70\,^{\circ}C}$ within the operating conditions of typical implantable devices. |
| title | QT-PUF: Quantum Tunneling Leakage Based PUF for Implantable IoMT Devices |
| topic | Cryptography and Security |
| url | https://arxiv.org/abs/2605.22113 |