Impact of Surface Treatment on Noise in PL-Measurements of Silicon Vacancies in 4H-SiC Lateral pin-Diodes

Fuente: arXiv

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Bibliographic Details
Main Authors:	Schwarberg, Jannik H., Magerl, Fabian, Beuer, Susanne, May, Alexander, Gobert, Christian, Siebert, Martin, Miersch, Christian, Möller, Heino, Knolle, Wolfgang, Luo, Chihang, Dick, Jan F., Beyer, Franziska C., Rommel, Mathias, Schulze, Jörg
Format:	Preprint
Published:	2026
Subjects:	Quantum Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2605.24157