From Full Boards to Tiny Defects: Scale-Aware Tile Inference with Topology-Aware Merging for High-Resolution PCB Defect Detection

Fuente: arXiv

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Bibliographic Details
Main Authors:	Shalmani, Mohammad Alijanpour, Boroujeni, Alale Rezvani, Amini, Ali, Yuan, Jiann Shiun
Format:	Preprint
Published:	2026
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2605.24726