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From Full Boards to Tiny Defects: Scale-Aware Tile Inference with Topology-Aware Merging for High-Resolution PCB Defect Detection

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Shalmani, Mohammad Alijanpour, Boroujeni, Alale Rezvani, Amini, Ali, Yuan, Jiann Shiun
Natura:	Preprint
Pubblicazione:	2026
Soggetti:	Computer Vision and Pattern Recognition
Accesso online:	Acceder al recurso
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