Experimental and computational diffusion analysis in Ni-X binary and Ni-Al-X (X = Cr, Mo, Ta, W, Re) ternary systems

Fuente: arXiv

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Bibliographic Details
Main Authors:	Srivastava, Ankur, Sadhu, Suman, Kumar, Satyam, Bansal, Ujjval, Ravi, Raju, Bhattacharyya, Saswata, Gautam, Gopalakrishnan Sai, Paul, Aloke
Format:	Preprint
Published:	2026
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2605.25425