Benchmarking Transparent Conductors
Fuente:
arXiv
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| Autori principali: | , |
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| Natura: | Preprint |
| Pubblicazione: |
2026
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| _version_ | 1866913161600303104 |
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| author | Cohen, Amit Kornblum, Lior |
| author_facet | Cohen, Amit Kornblum, Lior |
| contents | Transparent conducting oxides (TCOs) are central to optoelectronic technologies, yet their design is often guided by popular figures of merit that are disconnected from the electrical requirement of actual devices. As a result, widely used metrics guide material design under conditions that can be impractical for devices. Here, we introduce a benchmarking framework to guide TCO development, in which transparent conductors are evaluated at fixed, application-relevant sheet resistance $(R_S)$. The resulting metric, $T_{app}(R_S)$, anchors comparison to device requirements, asking instead: What optical transparency can be obtained at the sheet resistance required by a given application? This approach provides a directly interpretable measure of performance, enabling materials to be benchmarked in terms of absolute transparency gains at a specified $R_S$. Applied to representative conventional and emerging TCOs, the framework defines the sheet-resistance landscape relevant to each application and maps how different materials perform within it. In doing so, it provides an application-rooted guide to material development and selection. More broadly, this approach establishes a general strategy for evaluating materials under fixed operational constraints, bridging the gap between materials design and device integration. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2605_25904 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Benchmarking Transparent Conductors Cohen, Amit Kornblum, Lior Materials Science Transparent conducting oxides (TCOs) are central to optoelectronic technologies, yet their design is often guided by popular figures of merit that are disconnected from the electrical requirement of actual devices. As a result, widely used metrics guide material design under conditions that can be impractical for devices. Here, we introduce a benchmarking framework to guide TCO development, in which transparent conductors are evaluated at fixed, application-relevant sheet resistance $(R_S)$. The resulting metric, $T_{app}(R_S)$, anchors comparison to device requirements, asking instead: What optical transparency can be obtained at the sheet resistance required by a given application? This approach provides a directly interpretable measure of performance, enabling materials to be benchmarked in terms of absolute transparency gains at a specified $R_S$. Applied to representative conventional and emerging TCOs, the framework defines the sheet-resistance landscape relevant to each application and maps how different materials perform within it. In doing so, it provides an application-rooted guide to material development and selection. More broadly, this approach establishes a general strategy for evaluating materials under fixed operational constraints, bridging the gap between materials design and device integration. |
| title | Benchmarking Transparent Conductors |
| topic | Materials Science |
| url | https://arxiv.org/abs/2605.25904 |