FAB-Bench: A Framework for Adaptive RAG Benchmarking in Semiconductor Manufacturing

Fuente: arXiv

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Bibliographic Details
Main Authors:	Qian, Jingbin, Yi, Congwen, Xia, Min, Wu, Wen, Zhu, Jun, Guan, Jian
Format:	Preprint
Published:	2026
Subjects:	Computation and Language Information Retrieval
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2605.26476