MemFail: Stress-Testing Failure Modes of LLM Memory Systems

Fuente: arXiv
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Main Authors: Garg, Ishir, Kolhe, Neel, Song, Dawn, Zhao, Xuandong
Format: Preprint
Published: 2026
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_version_ 1866918523817689088
author Garg, Ishir
Kolhe, Neel
Song, Dawn
Zhao, Xuandong
author_facet Garg, Ishir
Kolhe, Neel
Song, Dawn
Zhao, Xuandong
contents Large language model (LLM) agents increasingly rely on external memory systems to remain consistent across long-horizon interactions, but little empirical work has been done to understand the specific failure modes and design choices that these systems present. Existing benchmarks report aggregate question-answering accuracy and treat memory systems as black boxes, making it impossible to attribute an incorrect answer to a particular failure mode of the system. We introduce MemFail, a diagnostic benchmark that isolates the failure modes of modern LLM memory systems. We begin by formalizing memory systems as the composition of three canonical operations -- summarization, storage, and retrieval -- and identify the potential failure modes induced by each. Based on these hypothesized failure modes, we construct five datasets spanning four tasks, each adversarially designed to test a specific operation of a memory system. Using these datasets, we evaluate four state-of-the-art memory systems on MemFail and demonstrate how MemFail can be used to empirically understand the tradeoffs induced by differences in memory system architectures.
format Preprint
id arxiv_https___arxiv_org_abs_2605_26667
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle MemFail: Stress-Testing Failure Modes of LLM Memory Systems
Garg, Ishir
Kolhe, Neel
Song, Dawn
Zhao, Xuandong
Artificial Intelligence
Machine Learning
Large language model (LLM) agents increasingly rely on external memory systems to remain consistent across long-horizon interactions, but little empirical work has been done to understand the specific failure modes and design choices that these systems present. Existing benchmarks report aggregate question-answering accuracy and treat memory systems as black boxes, making it impossible to attribute an incorrect answer to a particular failure mode of the system. We introduce MemFail, a diagnostic benchmark that isolates the failure modes of modern LLM memory systems. We begin by formalizing memory systems as the composition of three canonical operations -- summarization, storage, and retrieval -- and identify the potential failure modes induced by each. Based on these hypothesized failure modes, we construct five datasets spanning four tasks, each adversarially designed to test a specific operation of a memory system. Using these datasets, we evaluate four state-of-the-art memory systems on MemFail and demonstrate how MemFail can be used to empirically understand the tradeoffs induced by differences in memory system architectures.
title MemFail: Stress-Testing Failure Modes of LLM Memory Systems
topic Artificial Intelligence
Machine Learning
url https://arxiv.org/abs/2605.26667