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Individual Characterization of Fast-Responding Trap States at the NO-Annealed SiO$_2$/4H-SiC Interface

Fuente: arXiv
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Bibliographic Details
Main Authors: Ono, Takahiro, Ohashi, Mizuki, Shigeno, Tomohiro, Uchida, Yutaro, Yasui, Yuuki, Kita, Koji, Sugimoto, Yoshiaki
Format: Preprint
Published: 2026
Subjects:
Materials Science
Online Access:
Acceder al recurso
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