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Main Authors: Nenezic, Patrick, Vissers, Ewoud, Moerman, Arno, Bogaert, Laurens, Billet, Maximilien, Zheng, Xiujun, Vanackere, Tom, Niels, Margot, Papadopoulou, Athina, Uvin, Sarah, De Heyn, Peter, Saseendran, Sandeep, Atzeni, Simone, Kuyken, Bart
Format: Preprint
Published: 2026
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Online Access:https://arxiv.org/abs/2605.28765
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author Nenezic, Patrick
Vissers, Ewoud
Moerman, Arno
Bogaert, Laurens
Billet, Maximilien
Zheng, Xiujun
Vanackere, Tom
Niels, Margot
Papadopoulou, Athina
Uvin, Sarah
De Heyn, Peter
Saseendran, Sandeep
Atzeni, Simone
Kuyken, Bart
author_facet Nenezic, Patrick
Vissers, Ewoud
Moerman, Arno
Bogaert, Laurens
Billet, Maximilien
Zheng, Xiujun
Vanackere, Tom
Niels, Margot
Papadopoulou, Athina
Uvin, Sarah
De Heyn, Peter
Saseendran, Sandeep
Atzeni, Simone
Kuyken, Bart
contents We present a variability-aware simulation framework for heterogeneously integrated lithium niobate traveling-wave modulators. The framework incorporates fabrication-variation data obtained from our dedicated pilot line and enables efficient optimisation of geometric parameters to ensure stable device performance across wafer-scale manufacturing. The proposed multi-parameter optimisation method enables the efficient identification of modulator designs that simultaneously achieve target performance metrics (Vpi, optical insertion loss, and 3dB electro-optic bandwidth) while maintaining robustness against fabrication-induced variations. Using this methodology on two representative modulator architectures, we theoretically demonstrate that reliable wafer-scale integration of lithium niobate modulators on silicon photonics via micro-transfer printing is feasible and can be systematically engineered.
format Preprint
id arxiv_https___arxiv_org_abs_2605_28765
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle A variability-aware simulation and design workflow for wafer-scale, heterogeneously integrated lithium niobate modulators
Nenezic, Patrick
Vissers, Ewoud
Moerman, Arno
Bogaert, Laurens
Billet, Maximilien
Zheng, Xiujun
Vanackere, Tom
Niels, Margot
Papadopoulou, Athina
Uvin, Sarah
De Heyn, Peter
Saseendran, Sandeep
Atzeni, Simone
Kuyken, Bart
Optics
We present a variability-aware simulation framework for heterogeneously integrated lithium niobate traveling-wave modulators. The framework incorporates fabrication-variation data obtained from our dedicated pilot line and enables efficient optimisation of geometric parameters to ensure stable device performance across wafer-scale manufacturing. The proposed multi-parameter optimisation method enables the efficient identification of modulator designs that simultaneously achieve target performance metrics (Vpi, optical insertion loss, and 3dB electro-optic bandwidth) while maintaining robustness against fabrication-induced variations. Using this methodology on two representative modulator architectures, we theoretically demonstrate that reliable wafer-scale integration of lithium niobate modulators on silicon photonics via micro-transfer printing is feasible and can be systematically engineered.
title A variability-aware simulation and design workflow for wafer-scale, heterogeneously integrated lithium niobate modulators
topic Optics
url https://arxiv.org/abs/2605.28765