Aouadj, K., Fondacci, A., Morozzi, A., Passeri, D., Croci, T., Onder, S. A., . . . Moscatelli, F. (2026). Measurements and simulations of X-ray radiation damage effects on CNM n-type 4H-SiC MOS capacitors.
Chicago Style (17th ed.) CitationAouadj, Khaoula, et al. Measurements and Simulations of X-ray Radiation Damage Effects on CNM N-type 4H-SiC MOS Capacitors. 2026.
MLA (9th ed.) CitationAouadj, Khaoula, et al. Measurements and Simulations of X-ray Radiation Damage Effects on CNM N-type 4H-SiC MOS Capacitors. 2026.
Warning: These citations may not always be 100% accurate.