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Measurements and simulations of X-ray radiation damage effects on CNM n-type 4H-SiC MOS capacitors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Aouadj, Khaoula, Fondacci, Alessandro, Morozzi, Arianna, Passeri, Daniele, Croci, Tommaso, Onder, Sebastian Alexander, Radmanovac, Daniel, Bergauer, Thomas, Mattiazzo, Serena, Moscatelli, Francesco
Format:	Preprint
Published:	2026
Subjects:	Instrumentation and Detectors
Online Access:	Acceder al recurso
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