Defect-engineered scaling of lead-free ferroelectrics with ultralow-voltage switching
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arXiv
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| Autori principali: | , , , , , , , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2026
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| _version_ | 1866918531172401152 |
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| author | Ghanbari, Reza Wang, Jiayue KP, Harikrishnan Shi, Zixiao Khandelwal, Aarushi Koons, Konnor Rodrigues, Eli Zhou, Tao Holt, Martin Muller, David A. Hwang, Harold Y. Xu, Ruijuan |
| author_facet | Ghanbari, Reza Wang, Jiayue KP, Harikrishnan Shi, Zixiao Khandelwal, Aarushi Koons, Konnor Rodrigues, Eli Zhou, Tao Holt, Martin Muller, David A. Hwang, Harold Y. Xu, Ruijuan |
| contents | Scaling ferroelectrics to nanometer thicknesses remains a central challenge for low-power, nonvolatile electronics, as leakage currents increasingly dominate with reduced dimensions. Alkali-based, lead-free ferroelectrics offer an environmentally sustainable alternative to lead-based systems, yet their scaling is severely limited by leakage arising from volatile alkali constituents. Here, we show that this intrinsic limitation can be transformed into an advantageous degree of freedom through defect engineering. By precisely modulating alkali deficiency during thin-film synthesis, we engineer clustered defect complexes that function as deep trap states, strongly suppressing leakage and enabling robust ferroelectric operation in ultrathin films down to the sub-10 nm regime at voltages below 100 mV. Our results establish defect-enabled scaling as a viable pathway for advancing environmentally benign ferroelectrics toward ultra-low-power, non-volatile electronic technologies. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2605_30751 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Defect-engineered scaling of lead-free ferroelectrics with ultralow-voltage switching Ghanbari, Reza Wang, Jiayue KP, Harikrishnan Shi, Zixiao Khandelwal, Aarushi Koons, Konnor Rodrigues, Eli Zhou, Tao Holt, Martin Muller, David A. Hwang, Harold Y. Xu, Ruijuan Materials Science Scaling ferroelectrics to nanometer thicknesses remains a central challenge for low-power, nonvolatile electronics, as leakage currents increasingly dominate with reduced dimensions. Alkali-based, lead-free ferroelectrics offer an environmentally sustainable alternative to lead-based systems, yet their scaling is severely limited by leakage arising from volatile alkali constituents. Here, we show that this intrinsic limitation can be transformed into an advantageous degree of freedom through defect engineering. By precisely modulating alkali deficiency during thin-film synthesis, we engineer clustered defect complexes that function as deep trap states, strongly suppressing leakage and enabling robust ferroelectric operation in ultrathin films down to the sub-10 nm regime at voltages below 100 mV. Our results establish defect-enabled scaling as a viable pathway for advancing environmentally benign ferroelectrics toward ultra-low-power, non-volatile electronic technologies. |
| title | Defect-engineered scaling of lead-free ferroelectrics with ultralow-voltage switching |
| topic | Materials Science |
| url | https://arxiv.org/abs/2605.30751 |