APA (7th ed.) Citation

van Iersel, L., Jones, M., & Weller, M. (2026). Tree Containment Parameterized by Scanwidth.

Chicago Style (17th ed.) Citation

van Iersel, Leo, Mark Jones, and Mathias Weller. Tree Containment Parameterized by Scanwidth. 2026.

MLA (9th ed.) Citation

van Iersel, Leo, et al. Tree Containment Parameterized by Scanwidth. 2026.