Self-Tuning Regularization for Image Scanning Microscopy

Fuente: arXiv
Guardado en:
Detalles Bibliográficos
Autores principales: Agostoni, Sofia, Cuneo, Lisa, Daniele, Christian, Garré, Giacomo, Le, Laurent, Zunino, Alessandro, Vicidomini, Giuseppe, Calatroni, Luca
Formato: Preprint
Publicado: 2026
Materias:
Acceso en línea:
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
_version_ 1866911733294039040
author Agostoni, Sofia
Cuneo, Lisa
Daniele, Christian
Garré, Giacomo
Le, Laurent
Zunino, Alessandro
Vicidomini, Giuseppe
Calatroni, Luca
author_facet Agostoni, Sofia
Cuneo, Lisa
Daniele, Christian
Garré, Giacomo
Le, Laurent
Zunino, Alessandro
Vicidomini, Giuseppe
Calatroni, Luca
contents Image Scanning Microscopy (ISM) is a fluorescence imaging technique that combines detector-array acquisition and computational reconstruction to achieve the theoretical resolution of an ideal confocal microscope, i.e., one operating with an infinitesimally small pinhole, while maintaining high signal-to-noise ratio. Among the reconstruction methods for obtaining the super-resolved image, multi-image deconvolution (MID) and its extension aimed at preserving the optical sectioning capability of confocal microscopy, known as super-resolution sectioning ISM (s$^2$ISM), are among the most widely used approaches. Both methods rely on Richardson--Lucy-type iterative schemes, whose semi-convergent behavior requires early stopping and often leads to noise amplification and reconstruction artifacts. In this work, we introduce a self-tuning explicit regularization framework for both MID and s$^2$ISM reconstruction. Within a Bayesian maximum a posteriori formulation, we combine a multi-frame Poisson data fidelity term with explicit regularization, considering $\ell_1$ and smoothed total variation penalties as representative examples. We further develop an automatic and ground-truth-free strategy for regularization parameter selection by adapting the residual whiteness principle to the multi-frame Poisson setting and introducing a spectral high-pass extension tailored to s$^2$ISM. The resulting framework enables stable reconstructions without empirical stopping rules. To demonstrate the proposed framework, we consider first-order optimization schemes based on proximal gradient and mirror descent methods with adaptive backtracking strategies. Experiments on simulated and real fluorescence ISM datasets demonstrate improved reconstruction stability and image quality with respect to unregularized approaches, while enabling robust super-resolution and optical sectioning in low-photon conditions.
format Preprint
id arxiv_https___arxiv_org_abs_2605_31426
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Self-Tuning Regularization for Image Scanning Microscopy
Agostoni, Sofia
Cuneo, Lisa
Daniele, Christian
Garré, Giacomo
Le, Laurent
Zunino, Alessandro
Vicidomini, Giuseppe
Calatroni, Luca
Image and Video Processing
Computer Vision and Pattern Recognition
Optimization and Control
Image Scanning Microscopy (ISM) is a fluorescence imaging technique that combines detector-array acquisition and computational reconstruction to achieve the theoretical resolution of an ideal confocal microscope, i.e., one operating with an infinitesimally small pinhole, while maintaining high signal-to-noise ratio. Among the reconstruction methods for obtaining the super-resolved image, multi-image deconvolution (MID) and its extension aimed at preserving the optical sectioning capability of confocal microscopy, known as super-resolution sectioning ISM (s$^2$ISM), are among the most widely used approaches. Both methods rely on Richardson--Lucy-type iterative schemes, whose semi-convergent behavior requires early stopping and often leads to noise amplification and reconstruction artifacts. In this work, we introduce a self-tuning explicit regularization framework for both MID and s$^2$ISM reconstruction. Within a Bayesian maximum a posteriori formulation, we combine a multi-frame Poisson data fidelity term with explicit regularization, considering $\ell_1$ and smoothed total variation penalties as representative examples. We further develop an automatic and ground-truth-free strategy for regularization parameter selection by adapting the residual whiteness principle to the multi-frame Poisson setting and introducing a spectral high-pass extension tailored to s$^2$ISM. The resulting framework enables stable reconstructions without empirical stopping rules. To demonstrate the proposed framework, we consider first-order optimization schemes based on proximal gradient and mirror descent methods with adaptive backtracking strategies. Experiments on simulated and real fluorescence ISM datasets demonstrate improved reconstruction stability and image quality with respect to unregularized approaches, while enabling robust super-resolution and optical sectioning in low-photon conditions.
title Self-Tuning Regularization for Image Scanning Microscopy
topic Image and Video Processing
Computer Vision and Pattern Recognition
Optimization and Control
url https://arxiv.org/abs/2605.31426