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Autori principali: Xiao, Qing, Liu, Yanling, Ma, Changjian, Liu, Danqing, Qin, Zhiyuan, Zhao, Qianyi, Huang, Chengyuan, Ha, Mengke, Li, Zhenhao, Cheng, Guanglei
Natura: Preprint
Pubblicazione: 2026
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Accesso online:https://arxiv.org/abs/2606.01345
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author Xiao, Qing
Liu, Yanling
Ma, Changjian
Liu, Danqing
Qin, Zhiyuan
Zhao, Qianyi
Huang, Chengyuan
Ha, Mengke
Li, Zhenhao
Cheng, Guanglei
author_facet Xiao, Qing
Liu, Yanling
Ma, Changjian
Liu, Danqing
Qin, Zhiyuan
Zhao, Qianyi
Huang, Chengyuan
Ha, Mengke
Li, Zhenhao
Cheng, Guanglei
contents Complex oxide interfaces, such as \mathrm{SrTiO_3} and \mathrm{KTaO_3} based heterostructures, host rich correlated phenomena with strong potential for advanced device applications. However, these interfaces are extremely susceptible to contamination and defect formation during nanofabrication, which often compromises device performance. Here, we present a solvent-free method for patterning oxide interfaces by employing high-resolution transferable thin metal masks in conjunction with oxygen-enriched Ar+ milling, which enables a clean and well-controlled nanofabrication process. Transport measurements demonstrate that the fabricated devices preserve their intrinsic properties, including high carrier mobilities, with negligible degradation compared to the pristine interfaces. This technique offers a convenient and robust route for engineering high-performance oxide electronic devices with precisely tailored transport characteristics.
format Preprint
id arxiv_https___arxiv_org_abs_2606_01345
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle High-quality Nano-patterning of Oxide Interfaces Using Transferred Gold Mask
Xiao, Qing
Liu, Yanling
Ma, Changjian
Liu, Danqing
Qin, Zhiyuan
Zhao, Qianyi
Huang, Chengyuan
Ha, Mengke
Li, Zhenhao
Cheng, Guanglei
Materials Science
Mesoscale and Nanoscale Physics
Complex oxide interfaces, such as \mathrm{SrTiO_3} and \mathrm{KTaO_3} based heterostructures, host rich correlated phenomena with strong potential for advanced device applications. However, these interfaces are extremely susceptible to contamination and defect formation during nanofabrication, which often compromises device performance. Here, we present a solvent-free method for patterning oxide interfaces by employing high-resolution transferable thin metal masks in conjunction with oxygen-enriched Ar+ milling, which enables a clean and well-controlled nanofabrication process. Transport measurements demonstrate that the fabricated devices preserve their intrinsic properties, including high carrier mobilities, with negligible degradation compared to the pristine interfaces. This technique offers a convenient and robust route for engineering high-performance oxide electronic devices with precisely tailored transport characteristics.
title High-quality Nano-patterning of Oxide Interfaces Using Transferred Gold Mask
topic Materials Science
Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2606.01345