Drift-free characterization of electro-optic tuning efficiency in lithium niobate photonic nanocavities

Fuente: arXiv
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Autores principales: Zhang, Erqi, Yao, Danyang, Ran, Xu, Zhang, Yiwei, Li, Duomao, Wang, Youbin, Hu, Zhixuan, Song, Jiaren, Lu, Xiaoli, Ma, Xiaohua, Hao, Yue
Formato: Preprint
Publicado: 2026
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author Zhang, Erqi
Yao, Danyang
Ran, Xu
Zhang, Yiwei
Li, Duomao
Wang, Youbin
Hu, Zhixuan
Song, Jiaren
Lu, Xiaoli
Ma, Xiaohua
Hao, Yue
author_facet Zhang, Erqi
Yao, Danyang
Ran, Xu
Zhang, Yiwei
Li, Duomao
Wang, Youbin
Hu, Zhixuan
Song, Jiaren
Lu, Xiaoli
Ma, Xiaohua
Hao, Yue
contents Lithium niobate photonic crystal nanobeam cavity (PCNBC) represents a premier platform for integrated electro-optics, offering deep sub-wavelength mode confinement, enhanced light-matter interactions, and ultralow power consumption. However, accurate characterization of the electro-optic (EO) tuning efficiency in such high-Q devices is fundamentally impeded by DC drift, a time-dependent spectral instability arising from charge redistribution, surface screening, or buffer layer relaxation under sustained electric fields. Here, we report the systematic analysis of DC drift dynamics in lithium niobate nanocavities and demonstrate that conventional quasi-static DC voltage scanning yields highly unreliable characterization data. To circumvent this limitation, we introduce a drift-free, dynamic measurement methodology that employs high-frequency triangular-wave voltage sweeps to effectively decouple the instantaneous electronic Pockels response from slow charge-relaxation processes. Validated across 35 devices with varying electrode geometries, our method delivers reproducible tuning efficiency of 4.3-4.5 pm/V with a low coefficient of variation of 1.1%, showing excellent quantitative agreement with three-dimensional finite-element simulations. This robust, drift-free measurement technique establishes a rigorous standard for the characterization and optimization of resonant cavity electro-optics, accelerating the development of high-performance thin-film lithium niobate photonic integrated circuits.
format Preprint
id arxiv_https___arxiv_org_abs_2606_02216
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Drift-free characterization of electro-optic tuning efficiency in lithium niobate photonic nanocavities
Zhang, Erqi
Yao, Danyang
Ran, Xu
Zhang, Yiwei
Li, Duomao
Wang, Youbin
Hu, Zhixuan
Song, Jiaren
Lu, Xiaoli
Ma, Xiaohua
Hao, Yue
Optics
Lithium niobate photonic crystal nanobeam cavity (PCNBC) represents a premier platform for integrated electro-optics, offering deep sub-wavelength mode confinement, enhanced light-matter interactions, and ultralow power consumption. However, accurate characterization of the electro-optic (EO) tuning efficiency in such high-Q devices is fundamentally impeded by DC drift, a time-dependent spectral instability arising from charge redistribution, surface screening, or buffer layer relaxation under sustained electric fields. Here, we report the systematic analysis of DC drift dynamics in lithium niobate nanocavities and demonstrate that conventional quasi-static DC voltage scanning yields highly unreliable characterization data. To circumvent this limitation, we introduce a drift-free, dynamic measurement methodology that employs high-frequency triangular-wave voltage sweeps to effectively decouple the instantaneous electronic Pockels response from slow charge-relaxation processes. Validated across 35 devices with varying electrode geometries, our method delivers reproducible tuning efficiency of 4.3-4.5 pm/V with a low coefficient of variation of 1.1%, showing excellent quantitative agreement with three-dimensional finite-element simulations. This robust, drift-free measurement technique establishes a rigorous standard for the characterization and optimization of resonant cavity electro-optics, accelerating the development of high-performance thin-film lithium niobate photonic integrated circuits.
title Drift-free characterization of electro-optic tuning efficiency in lithium niobate photonic nanocavities
topic Optics
url https://arxiv.org/abs/2606.02216