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Bibliographic Details
Main Authors: Meneghini, C., Di Matteo, S., Monesi, C., Neisius, T., Paolasini, L., Mobilio, S., Natoli, C. R., Metcalf, P. A., Honig, J. M.
Format: Preprint
Published: 2005
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Online Access:https://arxiv.org/abs/cond-mat/0506432
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Table of Contents:
  • We performed near-edge x-ray absorption spectroscopy (XANES) at V K edge in the antiferromagnetic insulating (AFI) phase of a 2.8% Cr-doped V$_2$O$_3$ single crystal. Linear dichroism of several percent is measured in the hexagonal plane and found to be in good agreement with ab-initio calculations based on multiple scattering theory. This experiment definitively proves the structural origin of the signal and therefore solves a controversy raised by previous interpretations of the same dichroism as non-reciprocal. It also calls for a further investigation of the role of the magnetoelectric annealing procedure in cooling to the AFI phase.