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Hauptverfasser: Simonsen, I., Maradudin, A. A.
Format: Preprint
Veröffentlicht: 1998
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Online-Zugang:https://arxiv.org/abs/cond-mat/9808085
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author Simonsen, I.
Maradudin, A. A.
author_facet Simonsen, I.
Maradudin, A. A.
contents Electromagnetic wave scattering from planar dielectric films deposited on one-dimensional, randomly rough, perfectly conducting substrates is studied by numerical simulations for both p- and s-polarization. The reduced Rayleigh equation, which is the integral equation satisfied by the scattering amplitude after eliminating the fields inside the film, is the starting point for the simulation. This equation is solved numerically by considering a random surface of finite length, and by introducing wave number cut-offs in the evanescent part of the spectrum. Upon discretization, a system of linear equations is obtained, and by solving this matrix system for an ensemble of surface realizations, the contribution to the mean differential reflection coefficient from the incoherently scattered field, $<\partial R_ν/\partial θ>_{incoh}$ (ν=p,s), is obtained nonperturbatively. It is demonstrated that when the scattering geometry supports at least two guided waves, $<\partial R_ν/\partial θ>_{incoh}$, has, in addition to the well known enhanced backscattering peak, well-defined satellite peaks in agreement with theory, for most of the parameters considered.
format Preprint
id arxiv_https___arxiv_org_abs_cond_mat_9808085
institution arXiv
publishDate 1998
record_format arxiv
spellingShingle Numerical simulation of electromagnetic wave scattering from planar dielectric films deposited on rough perfectly conducting substrates
Simonsen, I.
Maradudin, A. A.
Condensed Matter
Electromagnetic wave scattering from planar dielectric films deposited on one-dimensional, randomly rough, perfectly conducting substrates is studied by numerical simulations for both p- and s-polarization. The reduced Rayleigh equation, which is the integral equation satisfied by the scattering amplitude after eliminating the fields inside the film, is the starting point for the simulation. This equation is solved numerically by considering a random surface of finite length, and by introducing wave number cut-offs in the evanescent part of the spectrum. Upon discretization, a system of linear equations is obtained, and by solving this matrix system for an ensemble of surface realizations, the contribution to the mean differential reflection coefficient from the incoherently scattered field, $<\partial R_ν/\partial θ>_{incoh}$ (ν=p,s), is obtained nonperturbatively. It is demonstrated that when the scattering geometry supports at least two guided waves, $<\partial R_ν/\partial θ>_{incoh}$, has, in addition to the well known enhanced backscattering peak, well-defined satellite peaks in agreement with theory, for most of the parameters considered.
title Numerical simulation of electromagnetic wave scattering from planar dielectric films deposited on rough perfectly conducting substrates
topic Condensed Matter
url https://arxiv.org/abs/cond-mat/9808085