Metrology

Fuente: DOAJ

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Bibliographic Details
Format:	Revista científica
Language:	EN
Published:	MDPI AG 2022
Subjects:	cyberphysical systems machine learning for metrology metrology for sustainable manufacturing measurement uncertainty in dynamic processes Electronic computers. Computer science QA75.5-76.95 Applied mathematics. Quantitative methods T57-57.97
Online Access:	Acceder al recurso
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Internet

https://doaj.org/toc/2673-8244