How to Sample Badly

Fuente: ERIC Institute of Education Sciences
Enregistré dans:
Détails bibliographiques
Auteur principal: Bookstein, Abrham
Format: Recurso educativo Open Access
Langue:en
Publié: 1974
Sujets:
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author Bookstein, Abrham
author_facet Bookstein, Abrham
Bookstein, Abrham
collection Education Resources Information Center
contents How to Sample Badly Bookstein, Abrham Error Patterns Library Research Research Methodology Sampling Statistical Analysis Statistical Bias Discusses three types of faults which commonly occur in statistical sampling. (JG)
format Recurso educativo Open Access
id eric_EJ098134
institution ERIC Institute of Education Sciences
language en
publishDate 1974
record_format eric
spellingShingle How to Sample Badly
Bookstein, Abrham
Error Patterns
Library Research
Research Methodology
Sampling
Statistical Analysis
Statistical Bias
How to Sample Badly Bookstein, Abrham Error Patterns Library Research Research Methodology Sampling Statistical Analysis Statistical Bias Discusses three types of faults which commonly occur in statistical sampling. (JG)
title How to Sample Badly
topic Error Patterns
Library Research
Research Methodology
Sampling
Statistical Analysis
Statistical Bias
url https://eric.ed.gov/?id=EJ098134