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Bibliographic Details
Main Author: Bookstein, Abrham
Format: Recurso educativo Open Access
Language:en
Published: 1974
Subjects:
Online Access:https://eric.ed.gov/?id=EJ098134
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Table of Contents:
  • How to Sample Badly Bookstein, Abrham Error Patterns Library Research Research Methodology Sampling Statistical Analysis Statistical Bias Discusses three types of faults which commonly occur in statistical sampling. (JG)