Heynen, J. (1980). International Micrographics Standards: Report of the 1979 Paris Meeting of ISO/TC171.
Chicago Style (17th ed.) CitationHeynen, Jeffrey. International Micrographics Standards: Report of the 1979 Paris Meeting of ISO/TC171. 1980.
MLA (9th ed.) CitationHeynen, Jeffrey. International Micrographics Standards: Report of the 1979 Paris Meeting of ISO/TC171. 1980.
Warning: These citations may not always be 100% accurate.