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(Appendix B) Chemical composition of the tephra layers of ODP Site 126-792 and 126-793

Fuente: PANGAEA

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Détails bibliographiques
Auteurs principaux:	Fujioka, Kantaro, Matsuo, Yoshiko, Nishimura, Akira, Koyama, Masato, Rodolfo, Kelvin S
Format:	Dataset Open Access
Langue:	en
Publié:	PANGAEA 1992
Sujets:	126-792A; Alkali; Alkali, standard deviation; Aluminium oxide; Aluminium oxide, standard deviation; Calcium oxide; Calcium oxide, standard deviation; Chromium(III) oxide; Chromium(III) oxide, standard deviation; DRILL; Drilling/drill rig; DSDP/ODP/IODP sample designation; Electron microprobe (EMP); Elements, total; Iron oxide, FeO; Iron oxide, FeO, standard deviation; Joides Resolution; Leg126; Magnesium oxide; Magnesium oxide, standard deviation; Manganese oxide; Manganese oxide, standard deviation; Nickel oxide; Nickel oxide, standard deviation; North Pacific Ocean; Ocean Drilling Program; ODP; Potassium oxide; Potassium oxide, standard deviation; Sample code/label; Sample comment; Silicon dioxide; Silicon dioxide, standard deviation; Sodium oxide; Sodium oxide, standard deviation; Standard deviation; Titanium dioxide; Titanium dioxide, standard deviation; Vanadium, standard deviation; Vanadium oxide
Accès en ligne:	Acceder al recurso
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_version_	1867172043873583104
author	Fujioka, Kantaro Matsuo, Yoshiko Nishimura, Akira Koyama, Masato Rodolfo, Kelvin S
author_facet	Fujioka, Kantaro Matsuo, Yoshiko Nishimura, Akira Koyama, Masato Rodolfo, Kelvin S
collection	Datos científicos de ciencias marinas y ambientales
contents
format	Dataset Open Access
id	pangaea_https___doi_org_10_1594_PANGAEA_770522
institution	PANGAEA
language	en
publishDate	1992
publisher	PANGAEA
record_format	pangaea
spellingShingle	(Appendix B) Chemical composition of the tephra layers of ODP Site 126-792 and 126-793 Fujioka, Kantaro Matsuo, Yoshiko Nishimura, Akira Koyama, Masato Rodolfo, Kelvin S 126-792A; Alkali; Alkali, standard deviation; Aluminium oxide; Aluminium oxide, standard deviation; Calcium oxide; Calcium oxide, standard deviation; Chromium(III) oxide; Chromium(III) oxide, standard deviation; DRILL; Drilling/drill rig; DSDP/ODP/IODP sample designation; Electron microprobe (EMP); Elements, total; Iron oxide, FeO; Iron oxide, FeO, standard deviation; Joides Resolution; Leg126; Magnesium oxide; Magnesium oxide, standard deviation; Manganese oxide; Manganese oxide, standard deviation; Nickel oxide; Nickel oxide, standard deviation; North Pacific Ocean; Ocean Drilling Program; ODP; Potassium oxide; Potassium oxide, standard deviation; Sample code/label; Sample comment; Silicon dioxide; Silicon dioxide, standard deviation; Sodium oxide; Sodium oxide, standard deviation; Standard deviation; Titanium dioxide; Titanium dioxide, standard deviation; Vanadium, standard deviation; Vanadium oxide
title	(Appendix B) Chemical composition of the tephra layers of ODP Site 126-792 and 126-793
topic	126-792A; Alkali; Alkali, standard deviation; Aluminium oxide; Aluminium oxide, standard deviation; Calcium oxide; Calcium oxide, standard deviation; Chromium(III) oxide; Chromium(III) oxide, standard deviation; DRILL; Drilling/drill rig; DSDP/ODP/IODP sample designation; Electron microprobe (EMP); Elements, total; Iron oxide, FeO; Iron oxide, FeO, standard deviation; Joides Resolution; Leg126; Magnesium oxide; Magnesium oxide, standard deviation; Manganese oxide; Manganese oxide, standard deviation; Nickel oxide; Nickel oxide, standard deviation; North Pacific Ocean; Ocean Drilling Program; ODP; Potassium oxide; Potassium oxide, standard deviation; Sample code/label; Sample comment; Silicon dioxide; Silicon dioxide, standard deviation; Sodium oxide; Sodium oxide, standard deviation; Standard deviation; Titanium dioxide; Titanium dioxide, standard deviation; Vanadium, standard deviation; Vanadium oxide
url	https://doi.org/10.1594/PANGAEA.770522