Skip to content
VuFind
  • Login
    • English
    • Deutsch
    • Español
    • Français
    • Italiano
Advanced
  • Cite this
  • Text this
  • Email this
  • Print
  • Export Record
    • Export to RefWorks
    • Export to EndNoteWeb
    • Export to EndNote
  • Save to List
  • Permanent link
Cover Image

Saved in:
Bibliographic Details
Main Authors: Saito, Saneatsu, Underwood, Michael B, Kubo, Yusuke, Expedition 322 Scientists
Format: Dataset Open Access
Language:en
Published: PANGAEA 2012
Subjects:
319-C0009A; 322-C0011B; 322-C0012A; Chikyu; DRILL; Drilling/drill rig; Elevation of event; Event label; Exp319; Exp322; File format; File size; Integrated Ocean Drilling Program / International Ocean Discovery Program; IODP; Latitude of event; Longitude of event; NanTroSEIZE Stage 2: Riser/Riserless Observatory 1; NanTroSEIZE Stage 2: Subduction Input; Uniform resource locator/link to raw data file
Online Access:https://doi.org/10.1594/PANGAEA.783292
Tags: Add Tag
No Tags, Be the first to tag this record!
  • Holdings
  • Description
  • Table of Contents
  • Comments
  • Similar Items
  • Staff View

Internet

https://doi.org/10.1594/PANGAEA.783292

Similar Items

  • Friction velocity dependence of sediments from the Nankai Trough, Japan
    by: Okuda, Hanaya, et al.
    Published: (2021)
  • Shear strength of IODP Expedition 322 and 333 sediments approaching subduction in the Nankai Trough, Japan
    by: Ikari, Matt J, et al.
    Published: (2014)
  • XRD raw data from IODP Exp319
    by: Saffer, Demian M, et al.
    Published: (2012)
  • (Table S1) Details of experiments at in-situ stress conditions from IODP Expedition 322 and 333 samples
    by: Ikari, Matt J, et al.
    Published: (2013)
  • Thermal conductivities from IODP Site 333-C0012
    by: Lin, Weiren, et al.
    Published: (2020)

Search Options

  • Search History
  • Advanced Search

Find More

  • Browse the Catalog
  • Browse Alphabetically
  • Explore Channels
  • Course Reserves
  • New Items

Need Help?

  • Search Tips
  • Ask a Librarian
  • FAQs