_version_ 1867170281030680576
author Schulte, Peter
Deutsch, Alexander
Salge, T
Berndt, J
Kontny, A
MacLeod, Kenneth G
Neuser, R D
Krumm, Stefan H
author_facet Schulte, Peter
Deutsch, Alexander
Salge, T
Berndt, J
Kontny, A
MacLeod, Kenneth G
Neuser, R D
Krumm, Stefan H
collection Datos científicos de ciencias marinas y ambientales
contents
format Dataset Open Access
id pangaea_https___doi_org_10_1594_PANGAEA_783594
institution PANGAEA
language en
publishDate 2009
publisher PANGAEA
record_format pangaea
spellingShingle (Table 3) Average compositions of Fe–Mg-rich spherules from the uppermost 0.5 to 0.7 mm of the spherule 207-1258B
Schulte, Peter
Deutsch, Alexander
Salge, T
Berndt, J
Kontny, A
MacLeod, Kenneth G
Neuser, R D
Krumm, Stefan H
207-1258B; Aluminium oxide; Aluminium oxide, standard deviation; Calcium oxide; Calcium oxide, standard deviation; DRILL; Drilling/drill rig; DSDP/ODP/IODP sample designation; Elements, total; Elements, total, standard deviation; Iron oxide, FeO; Iron oxide, FeO, standard deviation; Joides Resolution; Leg207; Magnesium oxide; Magnesium oxide, standard deviation; North Atlantic Ocean; Ocean Drilling Program; ODP; Potassium oxide; Potassium oxide, standard deviation; Sample amount; Sample code/label; Sample comment; Silicon dioxide; Silicon dioxide, standard deviation; Sodium oxide; Sodium oxide, standard deviation; Titanium dioxide; Titanium dioxide, standard deviation; X-ray diffraction (XRD)

title (Table 3) Average compositions of Fe–Mg-rich spherules from the uppermost 0.5 to 0.7 mm of the spherule 207-1258B
topic 207-1258B; Aluminium oxide; Aluminium oxide, standard deviation; Calcium oxide; Calcium oxide, standard deviation; DRILL; Drilling/drill rig; DSDP/ODP/IODP sample designation; Elements, total; Elements, total, standard deviation; Iron oxide, FeO; Iron oxide, FeO, standard deviation; Joides Resolution; Leg207; Magnesium oxide; Magnesium oxide, standard deviation; North Atlantic Ocean; Ocean Drilling Program; ODP; Potassium oxide; Potassium oxide, standard deviation; Sample amount; Sample code/label; Sample comment; Silicon dioxide; Silicon dioxide, standard deviation; Sodium oxide; Sodium oxide, standard deviation; Titanium dioxide; Titanium dioxide, standard deviation; X-ray diffraction (XRD)
url https://doi.org/10.1594/PANGAEA.783594