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(Table 2) Bulk geochemistry at DSDP Hole 54-424 recalculated on CaO-free basis

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Bibliographic Details
Main Authors:	Hoffert, Michel, Person, Alain, Courtois, Chantal, Karpoff, Anne Marie, Trauth, D
Format:	Dataset Open Access
Language:	en
Published:	PANGAEA 1980
Subjects:	54-424; Aluminium oxide; Barium oxide; Deep Sea Drilling Project; DRILL; Drilling/drill rig; DSDP; DSDP/ODP/IODP sample designation; Glomar Challenger; Iron oxide, Fe2O3; Leg54; Loss on ignition; Magnesium oxide; Manganous manganic oxide; North Pacific/MOUND; Potassium oxide; Sample code/label; Silicon dioxide; Sodium oxide; Titanium dioxide; X-ray diffraction (XRD)
Online Access:	Acceder al recurso
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_version_	1867169345412530176
author	Hoffert, Michel Person, Alain Courtois, Chantal Karpoff, Anne Marie Trauth, D
author_facet	Hoffert, Michel Person, Alain Courtois, Chantal Karpoff, Anne Marie Trauth, D
collection	Datos científicos de ciencias marinas y ambientales
contents
format	Dataset Open Access
id	pangaea_https___doi_org_10_1594_PANGAEA_823467
institution	PANGAEA
language	en
publishDate	1980
publisher	PANGAEA
record_format	pangaea
spellingShingle	(Table 2) Bulk geochemistry at DSDP Hole 54-424 recalculated on CaO-free basis Hoffert, Michel Person, Alain Courtois, Chantal Karpoff, Anne Marie Trauth, D 54-424; Aluminium oxide; Barium oxide; Deep Sea Drilling Project; DRILL; Drilling/drill rig; DSDP; DSDP/ODP/IODP sample designation; Glomar Challenger; Iron oxide, Fe2O3; Leg54; Loss on ignition; Magnesium oxide; Manganous manganic oxide; North Pacific/MOUND; Potassium oxide; Sample code/label; Silicon dioxide; Sodium oxide; Titanium dioxide; X-ray diffraction (XRD)
title	(Table 2) Bulk geochemistry at DSDP Hole 54-424 recalculated on CaO-free basis
topic	54-424; Aluminium oxide; Barium oxide; Deep Sea Drilling Project; DRILL; Drilling/drill rig; DSDP; DSDP/ODP/IODP sample designation; Glomar Challenger; Iron oxide, Fe2O3; Leg54; Loss on ignition; Magnesium oxide; Manganous manganic oxide; North Pacific/MOUND; Potassium oxide; Sample code/label; Silicon dioxide; Sodium oxide; Titanium dioxide; X-ray diffraction (XRD)
url	https://doi.org/10.1594/PANGAEA.823467