Electrical conductivity from IODP Hole 338-C0002L
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| Autori principali: | , , , , , , |
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| Natura: | Dataset Open Access |
| Lingua: | en |
| Pubblicazione: |
PANGAEA
2014
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| _version_ | 1867171823569862656 |
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| author | Moore, Gregory Kanagawa, Kyuichi Strasser, Michael Dugan, Brandon Maeda, Lena Toczko, Sean Expedition 338 Scientists |
| author_facet | Moore, Gregory Kanagawa, Kyuichi Strasser, Michael Dugan, Brandon Maeda, Lena Toczko, Sean Expedition 338 Scientists |
| collection | Datos científicos de ciencias marinas y ambientales |
| contents | |
| format | Dataset Open Access |
| id | pangaea_https___doi_org_10_1594_PANGAEA_829889 |
| institution | PANGAEA |
| language | en |
| publishDate | 2014 |
| publisher | PANGAEA |
| record_format | pangaea |
| spellingShingle | Electrical conductivity from IODP Hole 338-C0002L Moore, Gregory Kanagawa, Kyuichi Strasser, Michael Dugan, Brandon Maeda, Lena Toczko, Sean Expedition 338 Scientists 338-C0002L; Chikyu; Comment; Conductivity along Y-axis; Depth, bottom/max; DEPTH, sediment/rock; Depth, top/min; DRILL; Drilling/drill rig; DSDP/ODP/IODP sample designation; Electrical impedance magnitude Y; Electrical impedance phase angle Y; Exp338; Formation factor; Impedance analysis; Integrated Ocean Drilling Program / International Ocean Discovery Program; IODP; Nankai Trough; NanTroSEIZE Plate Boundary Deep Riser 2; Resistivity along Y-axis; Sample code/label; Sample code/label 2; Temperature, technical; Time Stamp |
| title | Electrical conductivity from IODP Hole 338-C0002L |
| topic | 338-C0002L; Chikyu; Comment; Conductivity along Y-axis; Depth, bottom/max; DEPTH, sediment/rock; Depth, top/min; DRILL; Drilling/drill rig; DSDP/ODP/IODP sample designation; Electrical impedance magnitude Y; Electrical impedance phase angle Y; Exp338; Formation factor; Impedance analysis; Integrated Ocean Drilling Program / International Ocean Discovery Program; IODP; Nankai Trough; NanTroSEIZE Plate Boundary Deep Riser 2; Resistivity along Y-axis; Sample code/label; Sample code/label 2; Temperature, technical; Time Stamp |
| url | https://doi.org/10.1594/PANGAEA.829889 |