_version_ 1867169100906627072
author Hirose, Takehiro
Saffer, Demian M
Tobin, Harold J
Toczko, Sean
Maeda, Lena
Kubo, Yusuke
Kimura, Gaku
Moore, Gregory F
Underwood, Michael B
Kanagawa, Kyuichi
Expedition 348 Scientists
author_facet Hirose, Takehiro
Saffer, Demian M
Tobin, Harold J
Toczko, Sean
Maeda, Lena
Kubo, Yusuke
Kimura, Gaku
Moore, Gregory F
Underwood, Michael B
Kanagawa, Kyuichi
Expedition 348 Scientists
collection Datos científicos de ciencias marinas y ambientales
contents
format Dataset Open Access
id pangaea_https___doi_org_10_1594_PANGAEA_842305
institution PANGAEA
language en
publishDate 2015
publisher PANGAEA
record_format pangaea
spellingShingle Electrical conductivity from IODP Hole 348-C0002P
Hirose, Takehiro
Saffer, Demian M
Tobin, Harold J
Toczko, Sean
Maeda, Lena
Kubo, Yusuke
Kimura, Gaku
Moore, Gregory F
Underwood, Michael B
Kanagawa, Kyuichi
Expedition 348 Scientists
348-C0002P; Anisotropy, impedance horizontal; Anisotropy, impedance vertical; Chikyu; Comment; Conductivity along X-axis; Conductivity along Y-axis; Conductivity along Z-axis; Depth, bottom/max; DEPTH, sediment/rock; DRILL; Drilling/drill rig; DSDP/ODP/IODP sample designation; Exp348; Impedance analysis; Integrated Ocean Drilling Program / International Ocean Discovery Program; IODP; Nankai Trough; NanTroSEIZE Plate Boundary Drilling 3; Resistivity along X-axis; Resistivity along Y-axis; Resistivity along Z-axis; Sample code/label; Sample code/label 2; Temperature, technical; Time Stamp

title Electrical conductivity from IODP Hole 348-C0002P
topic 348-C0002P; Anisotropy, impedance horizontal; Anisotropy, impedance vertical; Chikyu; Comment; Conductivity along X-axis; Conductivity along Y-axis; Conductivity along Z-axis; Depth, bottom/max; DEPTH, sediment/rock; DRILL; Drilling/drill rig; DSDP/ODP/IODP sample designation; Exp348; Impedance analysis; Integrated Ocean Drilling Program / International Ocean Discovery Program; IODP; Nankai Trough; NanTroSEIZE Plate Boundary Drilling 3; Resistivity along X-axis; Resistivity along Y-axis; Resistivity along Z-axis; Sample code/label; Sample code/label 2; Temperature, technical; Time Stamp
url https://doi.org/10.1594/PANGAEA.842305