(Table 2) Whole rock analyses and analytical errors from IODP Hole 343-C0019E

Fuente: PANGAEA
Salvato in:
Dettagli Bibliografici
Autori principali: Janssen, C, Naumann, Rudolf, Morales, L, Wirth, R, Rhede, D, Dresen, Georg
Natura: Dataset Open Access
Lingua:en
Pubblicazione: PANGAEA 2015
Soggetti:
Accesso online:
Tags: Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne!!
_version_ 1867168445203742720
author Janssen, C
Naumann, Rudolf
Morales, L
Wirth, R
Rhede, D
Dresen, Georg
author_facet Janssen, C
Naumann, Rudolf
Morales, L
Wirth, R
Rhede, D
Dresen, Georg
collection Datos científicos de ciencias marinas y ambientales
contents
format Dataset Open Access
id pangaea_https___doi_org_10_1594_PANGAEA_855667
institution PANGAEA
language en
publishDate 2015
publisher PANGAEA
record_format pangaea
spellingShingle (Table 2) Whole rock analyses and analytical errors from IODP Hole 343-C0019E
Janssen, C
Naumann, Rudolf
Morales, L
Wirth, R
Rhede, D
Dresen, Georg
343-C0019E; Birnessite; Chikyu; Chlorite; Chlorite, standard deviation; DRILL; Drilling/drill rig; DSDP/ODP/IODP sample designation; Exp343; Illite; Illite, standard deviation; Integrated Ocean Drilling Program / International Ocean Discovery Program; IODP; Japan Trench Fast Drilling Project; Moss, cover; Orthoclase; Orthoclase, standard deviation; Plagioclase; Plagioclase, standard deviation; Quartz; Quartz, standard deviation; Sample code/label; Sample ID; Smectite; Smectite, standard deviation; X-ray diffraction (XRD)

title (Table 2) Whole rock analyses and analytical errors from IODP Hole 343-C0019E
topic 343-C0019E; Birnessite; Chikyu; Chlorite; Chlorite, standard deviation; DRILL; Drilling/drill rig; DSDP/ODP/IODP sample designation; Exp343; Illite; Illite, standard deviation; Integrated Ocean Drilling Program / International Ocean Discovery Program; IODP; Japan Trench Fast Drilling Project; Moss, cover; Orthoclase; Orthoclase, standard deviation; Plagioclase; Plagioclase, standard deviation; Quartz; Quartz, standard deviation; Sample code/label; Sample ID; Smectite; Smectite, standard deviation; X-ray diffraction (XRD)
url https://doi.org/10.1594/PANGAEA.855667