van Peer, T. E., Liebrand, D., Xuan, C., Lippert, P. C., Agnini, C., Blum, N., . . . Wilson, P. A. (2017). Revised composite depth scale and splice analysis using detailed hole-to-hole correlations of high-resolution x-ray fluorescence core scanning for IODP Site 342-U1406. PANGAEA.
Chicago-Zitierstil (17. Ausg.)van Peer, Tim E., et al. Revised Composite Depth Scale and Splice Analysis Using Detailed Hole-to-hole Correlations of High-resolution X-ray Fluorescence Core Scanning for IODP Site 342-U1406. PANGAEA, 2017.
MLA-Zitierstil (9. Ausg.)van Peer, Tim E., et al. Revised Composite Depth Scale and Splice Analysis Using Detailed Hole-to-hole Correlations of High-resolution X-ray Fluorescence Core Scanning for IODP Site 342-U1406. PANGAEA, 2017.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.