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XRF scanning data for Br and Si/Al of sediment core EV13

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Bibliographic Details
Main Authors:	Wündsch, Michael, Haberzettl, Torsten, Cawthra, Hayley C, Kirsten, Kelly L, Quick, Lynne J, Zabel, Matthias, Frenzel, Peter, Hahn, Annette, Baade, Jussi, Daut, Gerhard, Kasper, Thomas, Meadows, Michael E, Mäusbacher, Roland
Format:	Dataset Open Access
Language:	en
Published:	PANGAEA 2018
Subjects:	AGE; Bromine; COMPCORE; Composite Core; DEPTH, sediment/rock; EV13; Lake Eilandvlei; RAiN; Regional Archives for Integrated iNvestigations; Silicon/Aluminium ratio; South Africa; X-ray fluorescence core scanner (XRF), Avaatech
Online Access:	Acceder al recurso
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author	Wündsch, Michael Haberzettl, Torsten Cawthra, Hayley C Kirsten, Kelly L Quick, Lynne J Zabel, Matthias Frenzel, Peter Hahn, Annette Baade, Jussi Daut, Gerhard Kasper, Thomas Meadows, Michael E Mäusbacher, Roland
author_facet	Wündsch, Michael Haberzettl, Torsten Cawthra, Hayley C Kirsten, Kelly L Quick, Lynne J Zabel, Matthias Frenzel, Peter Hahn, Annette Baade, Jussi Daut, Gerhard Kasper, Thomas Meadows, Michael E Mäusbacher, Roland
collection	Datos científicos de ciencias marinas y ambientales
contents
format	Dataset Open Access
id	pangaea_https___doi_org_10_1594_PANGAEA_887845
institution	PANGAEA
language	en
publishDate	2018
publisher	PANGAEA
record_format	pangaea
spellingShingle	XRF scanning data for Br and Si/Al of sediment core EV13 Wündsch, Michael Haberzettl, Torsten Cawthra, Hayley C Kirsten, Kelly L Quick, Lynne J Zabel, Matthias Frenzel, Peter Hahn, Annette Baade, Jussi Daut, Gerhard Kasper, Thomas Meadows, Michael E Mäusbacher, Roland AGE; Bromine; COMPCORE; Composite Core; DEPTH, sediment/rock; EV13; Lake Eilandvlei; RAiN; Regional Archives for Integrated iNvestigations; Silicon/Aluminium ratio; South Africa; X-ray fluorescence core scanner (XRF), Avaatech
title	XRF scanning data for Br and Si/Al of sediment core EV13
topic	AGE; Bromine; COMPCORE; Composite Core; DEPTH, sediment/rock; EV13; Lake Eilandvlei; RAiN; Regional Archives for Integrated iNvestigations; Silicon/Aluminium ratio; South Africa; X-ray fluorescence core scanner (XRF), Avaatech
url	https://doi.org/10.1594/PANGAEA.887845