Mojtabavi, S., Wilhelms, F., Cook, E., Davies, S. M., Sinnl, G., Skov Jensen, M., . . . Rasmussen, S. O. (2020). Specific conductivity measured with the dielectric profiling (DEP) technique on the EGRIP ice core, 13.77-1383.84 m depth. PANGAEA.
Chicago Style (17th ed.) CitationMojtabavi, Seyedhamidreza, et al. Specific Conductivity Measured with the Dielectric Profiling (DEP) Technique on the EGRIP Ice Core, 13.77-1383.84 M Depth. PANGAEA, 2020.
MLA (9th ed.) CitationMojtabavi, Seyedhamidreza, et al. Specific Conductivity Measured with the Dielectric Profiling (DEP) Technique on the EGRIP Ice Core, 13.77-1383.84 M Depth. PANGAEA, 2020.
Warning: These citations may not always be 100% accurate.