Table of Contents:
  • An M4 Tornado Micro-XRF spectrometer system (Bruker Nano Analytics) equipped with micro-focused Rh source (50 kV, 600 µA) and poly-capillary optics (25-µm spot size) was used for elemental mapping. Measurements were conducted under vacuum (20 mb) conditions with a resolution of 50 µm per pixel and a scan time of 60 ms per pixel. Maps of Al, Fe and S (counts) were exported from M4 Tornado Software version 1.3 as xy-matrices to csv files and further processed.