Comparative analysis of threshold voltage extraction techniques based in the MOSFET gm/ID characteristic

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Bibliographic Details
Main Author:	Arturo Fajardo Jaimes
Format:	Artículo científico
Language:	en
Published:	Universidad Distrital Francisco José de Caldas 2017
Subjects:	Ingeniería Gm MOSFET Modeling Threshold Voltage Extraction ID transconductance efficiency
Online Access:	Acceder al recurso 1 Acceder al recurso 2 Acceder al recurso 3 Acceder al recurso 4 Acceder al recurso 5
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