Extinction Phenomenon in X-Ray Diffraction Technique for Texture Analysis
Fuente:
Redalyc
Salvato in:
| Autore principale: | |
|---|---|
| Natura: | Artículo científico |
| Lingua: | en |
| Pubblicazione: |
Universidad Nacional Autónoma de México
2014
|
| Soggetti: | |
| Accesso online: | |
| Tags: |
Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne!!
|
| _version_ | 1876482632369307648 |
|---|---|
| author | Antonio Cadena-Arenas |
| author_facet | Antonio Cadena-Arenas |
| contents | Extinction Phenomenon in X-Ray Diffraction Technique for Texture Analysis Antonio Cadena-Arenas Jesús Palacios-Gómez Tetyana Kryshtab Andriy Kryvko Ingeniería texture • microstructure ray diffraction • primary extinction • secondary extinction • A method to correct pole densities (PD) for primary and secondary extinc- tion applied for maxima of pole figures (PF) measured by X-ray diffraction, was extended to correct the whole 111 and 200 PFs for nickel samples after 75% cold rolling and subsequent annealing at 600°C during 30 minutes. The PDs were corrected, and parameters of primary and secondary extinction were calculated using the PDs obtained in PFs measured for the first order reflections with two wavelengths (Cu Kα and Co Kα - radiations) and for the second order reflections with Cu Kα – radiation. Three orientation distribu- tion functions (ODF) were calculated, namely: the first one from 111, 200 and 220 PFs; the second one from 222 and 400 PFs (the second order reflections) and 220 PF (440 reflection is absent for the radiations used); the third one from corrected 111 and 200 PFs and not corrected 220 PF (for lack of the se- cond order reflection). Essential differences between the obtained ODFs in- dicate the necessity to take into account the extinction phenomenon in analysis of textured materials. The obtained parameters of extinction were used for the evaluation of microstructure details of textured nickel depen- ding on grains orientation that is not easily obtained by conventional meta- llographic methods. 2014 artículo científico 1405-7743 https://www.redalyc.org/articulo.oa?id=40430749008 en http://www.redalyc.org/revista.oa?id=404 Ingeniería. Investigación y Tecnología application/pdf Universidad Nacional Autónoma de México Ingeniería. Investigación y Tecnología (México) Num.2 Vol.XV |
| format | Artículo científico |
| id | redalyc_40430749008 |
| institution | Redalyc |
| language | en |
| publishDate | 2014 |
| publisher | Universidad Nacional Autónoma de México |
| spellingShingle | Extinction Phenomenon in X-Ray Diffraction Technique for Texture Analysis Antonio Cadena-Arenas Ingeniería texture • microstructure ray diffraction • primary extinction • secondary extinction • Extinction Phenomenon in X-Ray Diffraction Technique for Texture Analysis Antonio Cadena-Arenas Jesús Palacios-Gómez Tetyana Kryshtab Andriy Kryvko Ingeniería texture • microstructure ray diffraction • primary extinction • secondary extinction • A method to correct pole densities (PD) for primary and secondary extinc- tion applied for maxima of pole figures (PF) measured by X-ray diffraction, was extended to correct the whole 111 and 200 PFs for nickel samples after 75% cold rolling and subsequent annealing at 600°C during 30 minutes. The PDs were corrected, and parameters of primary and secondary extinction were calculated using the PDs obtained in PFs measured for the first order reflections with two wavelengths (Cu Kα and Co Kα - radiations) and for the second order reflections with Cu Kα – radiation. Three orientation distribu- tion functions (ODF) were calculated, namely: the first one from 111, 200 and 220 PFs; the second one from 222 and 400 PFs (the second order reflections) and 220 PF (440 reflection is absent for the radiations used); the third one from corrected 111 and 200 PFs and not corrected 220 PF (for lack of the se- cond order reflection). Essential differences between the obtained ODFs in- dicate the necessity to take into account the extinction phenomenon in analysis of textured materials. The obtained parameters of extinction were used for the evaluation of microstructure details of textured nickel depen- ding on grains orientation that is not easily obtained by conventional meta- llographic methods. 2014 artículo científico 1405-7743 https://www.redalyc.org/articulo.oa?id=40430749008 en http://www.redalyc.org/revista.oa?id=404 Ingeniería. Investigación y Tecnología application/pdf Universidad Nacional Autónoma de México Ingeniería. Investigación y Tecnología (México) Num.2 Vol.XV |
| title | Extinction Phenomenon in X-Ray Diffraction Technique for Texture Analysis |
| topic | Ingeniería texture • microstructure ray diffraction • primary extinction • secondary extinction • |
| url | https://www.redalyc.org/articulo.oa?id=40430749008 |